Step Process: | |
12. | PBLOCOS. Deposition of a stacked silicon dioxide, polysilicon and nitride films. |
13. | Active area definition. |
14. | Channel stopper implantation |
15. | Field oxide growing at 1000˚C. Tox = 0.58 μm, t = 2 hours |
16. | VTn boron adjust implantation |
17. | VTp boron adjust implantation |
18. | Gate oxide T = 900˚C, Tox = 20 nm. |
19. | LPCVD Gate Poly, Tpoly = 400 nm |
20. | Poly phosphorus doping at 1000˚C, 10 Ω/□ |
21. | Source/Drain implantation |
22. | Dopant activation at 950˚C. |
23. | Titanium Salicidation at 900˚C |