| Step Process: | |
| 12. | PBLOCOS. Deposition of a stacked silicon dioxide, polysilicon and nitride films. |
| 13. | Active area definition. |
| 14. | Channel stopper implantation |
| 15. | Field oxide growing at 1000˚C. Tox = 0.58 μm, t = 2 hours |
| 16. | VTn boron adjust implantation |
| 17. | VTp boron adjust implantation |
| 18. | Gate oxide T = 900˚C, Tox = 20 nm. |
| 19. | LPCVD Gate Poly, Tpoly = 400 nm |
| 20. | Poly phosphorus doping at 1000˚C, 10 Ω/□ |
| 21. | Source/Drain implantation |
| 22. | Dopant activation at 950˚C. |
| 23. | Titanium Salicidation at 900˚C |