Antireflection layer

Refractive index at l = 600 nm

RID (Dn_t)

Average reflectance R (%)

SiN_x

1.86

67

9.1

Al₂O₃

1.77

127

9.2

ZrO₂

2.16

142

9.4

SiN_x

2.2

161

10.8

SiN_x

2.4

279

13.1

SiO₂

1.46

344

14.3

TiO₂

2.60

445

15