Layers properties

CIGSe

ODC

ZnS

i-ZnO

ZnO:Al

Thickness (μm)

3

0.015 [7] [10]

0.02

0.02

0.03

Band gap Eg (eV)

1.19

1.34

3.6

3.2

3.2

Electron affinity

χ (eV)

4.5

[10]

4.5

[10]

4.15

4.5

[10]

4.5

[10]

Dielectric constant εr

13.6

[7] [10]

13.6

[7] [10]

9

9

[7] [10]

9

[7] [10]

NC (cm−3)/ NV (cm−3)

6.8 × 1017/

1.5 × 1019

[7] [10]

6.8 × 1017/

1.5 × 1019

[7] [10]

2.2 × 1018/

1.8 × 1019

3 × 1018/

1.7 × 1019

[7] [10]

3 × 1018/

1.7 × 1019

[7] [10]

S t h p , S t h n (cm/s)

107

μn (cm2/Vs)/ μp (cm2/Vs)

100/50

[7] [10]

10/1.25

[7] [10]

100/25

100/31

[7]

100/31

[7] [10]

Doping level (cm−3)

2.1017 (a)

2.1017(a)

1018 (d)

1018 (d)

1020 (d)

Bulk Gaussian defect states

Nt (cm−3)

1014 (D)

[7] [9] [10]

1014 (D)

[7] [9] [10]

1017 (A)

1017(A)

1017 (A)

EGD, EGA (eV)

Mid-gap

WGD, WDA (eV)

0.01

σn (cm2)/

σp (cm2)

10−13/

10−15

[7] [10]

10−13/

10−15

[7] [10]

10−15/

5 × 10−13

[7] [10]

10−15/

5 × 10−13

[7] [10]

10−15/

5 × 10−13

[7] [10]

Interface Gaussian defect states

CIGSe/ODC

ODC(CIGSe)/ZnS

ZnS/i-ZnO

ΔEC (eV)

0

0.35 (0.35)

−0.35

ΔEV (eV)

−0.15

−1.91 (−2.06)

0.05

Nt (cm−2)

1010 (D)

3 × 1018 (D)

-

EGD/EGA (eV)

Mid-gap

WGD/WDA (eV)

0.01

σn (cm2)/

σp (cm2)

10−13

10−15

10−13

10−15

- [7] [10]