Sample

Heating temperature (K) for 4.20 × 102 s in air

Thickness of films (nm) by TEM observation

Compositional ratio

(at%) by EDX

Mass% of oxide films and their crystallite sizes (nm) by XRD*

Cu

O

Cu2O

CuO

1)

523

around 40

90

10

6.0 (19.9)

0.25 (5.1)

2)

573

around 100

85

15

13.2 (17.4)

0.40 (5.6)

3)

623

non-uniform

82

18

22.6 (9.2)

6.05 (3.6)