Time | Representatives | Main work |
1971 | Yoneda Y, Horiuchi T | First proposed to apply total reflection technology to XRF |
1978 | Knoth, J. and Schwenke, H | Found element traces on the ppb-level |
1981 | Rich Seifer West Germany | Successfully developed the first commercial total reflection X-ray fluorescence spectrometer |
1983 | Becker | Studied the relationship between fluorescence intensity and angle below the critical angle |
1986 | Iida, A., Yoshinaga, A | Apply synchrotron radiation to TXRF |
1991 | Wobrauschek, Aiginger, Schwenke, and Knoth | Won the distinguished Bunsen?Kirchhoff Prize for the development of TXRF |
1997 | Klockenkamper [23] | Publication of the first monograph on TXRF |