Time

Representatives

Main work

1971

Yoneda Y, Horiuchi T

First proposed to apply total reflection technology to XRF

1978

Knoth, J. and Schwenke, H

Found element traces on the ppb-level

1981

Rich Seifer West Germany

Successfully developed the first commercial total reflection X-ray fluorescence spectrometer

1983

Becker

Studied the relationship between fluorescence intensity and angle below the critical angle

1986

Iida, A., Yoshinaga, A

Apply synchrotron radiation to TXRF

1991

Wobrauschek, Aiginger, Schwenke, and Knoth

Won the distinguished Bunsen?Kirchhoff Prize for the development of TXRF

1997

Klockenkamper [23]

Publication of the first monograph on TXRF