| Scanning Electron Microscopes (SEM) | Transmission Electron Microscopes (TEM) |
Electron stream | Fine, focused beam | Broad beam |
Image taken | Topographical/surface | Internal structure |
Resolution | Lower resolution | Higher resolution |
Magnification | Up to 2,000,000 times | Up to 50,000,000 times |
Image dimension | 3-D | 2-D |
Sample thickness | Thin and thick samples okay | Ultrathin samples only |
Penetrates sample | No | Yes |
Sample restriction | Less restrictive | More restrictive |
Sample preparation | Less preparation required | More preparation required |
Cost | Less expensive | More expensive |
Speed | Faster | Slower |
Operation | Easy to use | More complicated; requires training |