Layers properties | ||||
| i-Zno | CdS | SDL | CIGS |
Thickness (nm) | 300 | 50 | 15 | 2500 |
Band gap (eV) | 3.3 | 2.4 | 1.3 | 1.25 |
Electron Affinity (eV) | 4.55 | Variable | Variable | Variable |
Diélectric relative Permittivity | 9.00 | 10 | 13.6 | 13.6 |
Effective densité of state in BC (cm−3) |
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Effective densité of state in BV (cm−3) |
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Electrons thermal velocity (cm/s) |
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Holes thermal velocity (cm/s) |
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Electrons Mobility (cm2/Vs) | 100 | 72 | 10 | 100 |
Holes Mobility (cm2/Vs) | 31 | 20 | 1.25 | 12.5 |
Doping concentration (cm−3) |
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Bulk defect properties | ||||
Bulk defect Density (cm−3) |
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Capture cross-section electrons (cm2) |
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Capture cross-section holes (cm2) |
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Interface Properties | ||||
| CdS/SDL | SDL/CIGS | ||
Interface defect density (cm−2) | Variable | Variable | ||
Capture cross-section electrons (cm2) |
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Capture cross-section holes (cm2) |
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