SE-T1WI parameters

3D-GRE parameters

3D-IR-BTFE parameters

FOV

230

FOV

240

FOV

230

RFOV

80

RFOV

100

RFOV

80

Matrix

256

Matrix

240

Matrix

224

Recon

512

Recon

256

Recon

256

Scan %

70

Scan %

78.54

Scan %

110

SENSE

No

SENSE

yes

SENSE

Yes

Slices

48

Slices

175

Slices

140

Slice thickness

3

Slice thickness

1

Slice thickness

1

Slice gap

0

Slice gap

0

Slice gap

0

Scan mode

MS

Scan mode

3D

Scan mode

3D

Technique

SE

Technique

FFE

Technique

FFE

TR

462

TR

25

TR

4.3

TE

15

TE

4.6

TE

2.2

Flip angle

90

Flip angle

30

Flip angle

60

NSA

2

NSA

1

NSA

2

Scan time

6:48

Scan time

4:52

Scan time

3:38

P reduction

2

P reduction

2.5

S reduction

2

S reduction

1

TFE factor

256

Shot interval

4000